A New Device for measuring Thickness of Evaporated Metal Film by Use of X-ray Interference Fringes
- 1 December 1959
- journal article
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 14 (12) , 1828
- https://doi.org/10.1143/jpsj.14.1828
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Interferenz von Röntgenstrahlen an dünnen SchichtenAnnalen der Physik, 1931