Comment on “Characterization of Self-Assembled Monolayers on Silver and Gold Using Surface Plasmon Resonance Spectroscopy”
- 1 October 1997
- journal article
- editorial
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 101 (40) , 8041-8042
- https://doi.org/10.1021/jp971358t
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Two-color approach for determination of thickness and dielectric constant of thin films using surface plasmon resonance spectroscopyOptics Communications, 1996
- In Situ Kinetics of Self-Assembly by Surface Plasmon Resonance SpectroscopyLangmuir, 1996
- Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonanceOptics Communications, 1991