Capacitance Observations of Landau Levels in Surface Quantization
- 22 July 1968
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 21 (4) , 212-215
- https://doi.org/10.1103/physrevlett.21.212
Abstract
Capacitance observations of Landau levels in a two-dimensional electron gas induced in the inversion layer on a (100) surface of -type silicon are reported. Evidence for surface quantization and the associated lifting of the spin and valley degeneracy are presented. An observed increase in the carrier threshold with increasing magnetic field is shown to be further evidence of surface quantization.
Keywords
This publication has 4 references indexed in Scilit:
- Mobility Anisotropy and Piezoresistance in Silicon p-Type Inversion LayersJournal of Applied Physics, 1968
- Properties of Semiconductor Surface Inversion Layers in the Electric Quantum LimitPhysical Review B, 1967
- Magneto-Oscillatory Conductance in Silicon SurfacesPhysical Review Letters, 1966
- Negative Field-Effect Mobility on (100) Si SurfacesPhysical Review Letters, 1966