Time Resolved Electron Deposition Studies at High Dose Rates in Dielectrics

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Abstract
The grazing electron beam probe technique has been used to study the behavior of the electric field external to planar irradiated samples in vacuo. The trapped charge density can be determined from these data so that its behavior during and subsequent to the irradiation period can be studied with microsecond time resolution. Secondary phenomena associated with high-rate electron deposition of energy in dielectrics at dose rates from 106 to 1010 rads/sec are discussed and include charged particle emission, backscatter, and luminescence. The measurements have been conducted with simultaneous determination of the trapped charge level in the irradiated sample.