Transient electrical measurements of amorphous chalcogenide thin films
- 1 January 1970
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 2, 125-132
- https://doi.org/10.1016/0022-3093(70)90127-4
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Ovonic threshold switching characteristicsJournal of Non-Crystalline Solids, 1970
- Phenomenology of switching and memory effects in semiconducting chalcogenide glassesJournal of Non-Crystalline Solids, 1970
- Electrical conductivity of amorphous chalcogenide alloy filmsJournal of Non-Crystalline Solids, 1970
- Energy-controlled switching process in the amorphous system TeAsGeSiJournal of Non-Crystalline Solids, 1970
- Experimental results in amorphous semiconductor switching behaviorJournal of Non-Crystalline Solids, 1970
- Simple Band Model for Amorphous Semiconducting AlloysPhysical Review Letters, 1969
- Conduction and Electrical Switching in Amorphous Chalcogenide Semiconductor FilmsPhysical Review B, 1969
- Recombination Processes in Insulators and SemiconductorsPhysical Review B, 1955