Laser diode light efficiency determination by thermoreflectance microscopy
- 15 August 2001
- journal article
- Published by Elsevier in Microelectronics Journal
- Vol. 32 (10-11) , 899-901
- https://doi.org/10.1016/s0026-2692(01)00079-9
Abstract
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This publication has 1 reference indexed in Scilit:
- Temperature measurements of metal lines under current stress by high-resolution laser probingIEEE Transactions on Instrumentation and Measurement, 1999