Imaging Time-of-Flight Secondary Ion Mass Spectrometry Allows Visualization and Analysis of Coexisting Phases in Langmuir−Blodgett Films
- 1 January 1996
- journal article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 12 (7) , 1708-1711
- https://doi.org/10.1021/la950614v
Abstract
No abstract availableKeywords
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