Electronic structure of the unreconstructed 30° partial dislocation in silicon
- 15 October 1981
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 24 (8) , 4623-4628
- https://doi.org/10.1103/physrevb.24.4623
Abstract
The electronic structure of the unreconstructed 30° partial dislocation in silicon is calculated using a local pseudopotential and a minimal basis set. The minimal basis set consists of - and -symmetry orbitals and is augmented by five -symmetry orbitals. The model-core geometry is determined by high-resolution electron microscopy. The calculation indicates the existence of a one-dimensional band of dangling-bond states which propagate along the dislocation line. This band is half filled, implying metallic properties.
Keywords
This publication has 10 references indexed in Scilit:
- Microscopic Theory of the Phase Transformation and Lattice Dynamics of SiPhysical Review Letters, 1980
- New localized-orbital method for calculating the electronic structure of molecules and solids: Covalent semiconductorsPhysical Review B, 1980
- Calculation of structurally related properties of bulk and surface SiPhysical Review B, 1980
- The Structure And Electrical Properties Of Dislocations In SemiconductorsJournal of Microscopy, 1980
- Electron states associated with partial dislocations in siliconPhysica Status Solidi (b), 1979
- On the mobility of partial dislocations in siliconPhilosophical Magazine, 1977
- Gaussian representations of covalent wave functions; siliconPhysical Review B, 1976
- The principles and practice of the weak‐beam method of electron microscopyJournal of Microscopy, 1973
- LXXXVII. Theory of dislocations in germaniumJournal of Computers in Education, 1954
- Some Predicted Effects of Temperature Gradients on Diffusion in CrystalsPhysical Review B, 1953