A rigorous dispersive characterization of microstrip cross and tee junctions
- 4 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- An accurate characterization of open microstrip discontinuities including radiation lossesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Equivalent circuits of microstrip discontinuities including radiation effectsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Full-wave, finite element analysis of irregular microstrip discontinuitiesIEEE Transactions on Microwave Theory and Techniques, 1989
- Microstrip open-end and gap discontinuities in a substrate-superstrate structureIEEE Transactions on Microwave Theory and Techniques, 1989
- Arbitrarily shaped microstrip structures and their analysis with a mixed potential integral equationIEEE Transactions on Microwave Theory and Techniques, 1988
- Full-Wave Analysis of Microstrip Open-End and Gap DiscontinuitiesIEEE Transactions on Microwave Theory and Techniques, 1985
- Frequency-Dependent Characteristics of Microstrip Discontinuities in Millimeter-Wave Integrated CircuitsIEEE Transactions on Microwave Theory and Techniques, 1985