Degradation in on-state characteristics of IGBTs through self-heating

• 1 January 1994
• journal article
• Published by Institution of Engineering and Technology (IET) in IEE Proceedings - Circuits, Devices and Systems
• Vol. 141  (6) , 439
• https://doi.org/10.1049/ip-cds:19941392

Abstract

Keywords

• THERMAL ANALYSIS
• HEAT FLOW EQUATION