Soft X-Ray Photoelectric Yield Formulas

Abstract
Thick target x‐ray photoelectric yield formulas are derived assuming a simple range for photoelectrons in the target. The predictions are compared with available experimental results for Cu Kα x rays impinging on Al, Cr, and Sn targets at an angle of 70°. Agreement is within a factor of 2 for Al and within 10% for Cr and Sn.

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