Analytic fitting of monoenergetic peaks from Si(Li) X-ray spectrometers
- 1 April 1985
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 9 (1) , 71-79
- https://doi.org/10.1016/0168-583x(85)90780-3
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Measurement of the low energy tail spectra adjacent to the x-ray photopeak in Si(Li) x-ray detectorsNuclear Instruments and Methods in Physics Research, 1983
- Modifications of the HEX program for fast automatic resolution of PIXE‐spectraX-Ray Spectrometry, 1982
- Thick target pixe analysis and yield curve calculationsNuclear Instruments and Methods, 1981
- Analytical functions for fitting peaks from Ge semiconductor detectorsNuclear Instruments and Methods, 1980
- A radially dependent photopeak efficiency model for Si(Li) detectorsNuclear Instruments and Methods, 1980
- Development of the detector response function approach in the least-squares analysis of X-ray fluorescence spectraNuclear Instruments and Methods, 1979
- Escape peak losses in Si(Li) detectorsX-Ray Spectrometry, 1979
- Automatic analysis of gamma-ray spectra from germanium detectorsNuclear Instruments and Methods, 1976
- Photopeak method for the computer analysis of gamma-ray spectra from semiconductor detectorsNuclear Instruments and Methods, 1969
- Intensity Corrections for Iodine X-Rays Escaping from Sodium Iodide Scintillation CrystalsReview of Scientific Instruments, 1954