The Au/Si(111)7×7 interface: Correlation between electronic and morphological properties by high-resolution electron energy-loss spectroscopy, ultraviolet photoemission spectroscopy, and transmission electron microscopy

1 September 1988

journal article
Published by American Vacuum Society in Journal of Vacuum Science & Technology A

Vol. 6 (5) , 2904-2909
https://doi.org/10.1116/1.575449

Abstract

We have studied the diffusive Au/Si(111)-7×7 interface by surface sensitive techniques (high-resolution electron energy-loss and ultraviolet photoemission spectroscopies) and by transmission electron microscopy (TEM). The combination of the spectroscopic methods with TEM allows us to propose a new morphological description of the layer growing at room temperature, namely, that there are crystallites of pure Au embedded in an amorphous AuxSi1−x alloy matrix.

Keywords

ENERGY DISSIPATION
TRANSMISSION ELECTRON MICROSCOPY
HIGH RESOLUTION
PHOTOEMISSION SPECTROSCOPY

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