Method for the determination of the thermophysical properties of evaporated thin films
- 1 August 1973
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 17 (2) , 157-161
- https://doi.org/10.1016/0040-6090(73)90124-7
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Total emittance measurements of thin metallic films at cryogenic temperaturesJournal of Spacecraft and Rockets, 1970
- Temperature Coefficient of Resistance in Thin Metal FilmsJournal of Applied Physics, 1966
- The mean free path of electrons in metalsAdvances in Physics, 1952