Determination of gap-state distributions in amorphous semiconductors from transient photocurrents using a fourier transform technique
- 1 August 1992
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 83 (6) , 401-405
- https://doi.org/10.1016/0038-1098(92)90076-l
Abstract
No abstract availableKeywords
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