An inquiry concerning the principles of Si 2p core-level photoemission shift assignments at the Si/SiO2 interface
- 1 July 1996
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 14 (4) , 2824-2831
- https://doi.org/10.1116/1.588840