Aliasing probability of non-exhaustive randomized syndrome tests
- 6 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
A comprehensive design methodology which includes built-in self-test (BIST) cannot be achieved without performance measures of BIST techniques. Exact and asymptotic expressions are derived for the aliasing probability of randomized syndrome testing using the independent error model proposed by T.W. Williams et al. (IEEE Trans. Computer-Aided Design, vol.7, no.1, p.75-83, 1988). It is shown that randomized syndrome testing outperforms signature analysis for a substantial class of functions, and that existing methods can be used to transform the remaining functions during test mode.<>Keywords
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