Open-structure resonant technique for measuring the dielectric properties of materials
- 1 June 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 47 (3) , 666-673
- https://doi.org/10.1109/19.744321
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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