Advanced library characterization for high-performance ASIC

Publisher Website

9 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/asic.1991.242888

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

Statistical Modeling for Efficient Parametric Yield Estimation of MOS VLSI Circuits
IEEE Journal of Solid-State Circuits, 1985