Ellipsometry of an Absorbing Film below Monolayer Coverage: Cs/W
- 1 February 1972
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 62 (2) , 291-292
- https://doi.org/10.1364/josa.62.000291
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 3 references indexed in Scilit:
- Cesium on tungsten (011) face; structure and work functionSurface Science, 1970
- Ellipsometry for Measurements at and below Monolayer CoverageJournal of the Optical Society of America, 1968
- Optical Constants of Rubidium and CesiumJournal of the Optical Society of America, 1937