An Automatic Technique for Accurate Measurements of Seebeck Coefficient
- 1 January 1967
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 38 (1) , 66-68
- https://doi.org/10.1063/1.1720530
Abstract
A simple and rapid automatic method for measuring the Seebeck coefficient of semiconductors is described. Provided that errors due to sample mounting and contacting are negligible, 1% accuracy can be achieved.This publication has 1 reference indexed in Scilit:
- Apparatus for Accurate Measurement of Thermoelectric PowerReview of Scientific Instruments, 1960