X‐Ray Measurement of Residual Stresses in Textured Thin Coatings
Open Access
- 1 January 1991
- journal article
- research article
- Published by Wiley in Texture, Stress, and Microstructure
- Vol. 14 (1) , 73-78
- https://doi.org/10.1155/tsm.14-18.73
Abstract
The X-ray diffraction technique is a well known non-destructive method to determine the residual stress level in a material. The most commonly used method is the 'd-sin2Ψ' method. However for textured materials and very thin coatings (0.1 .. 2 μm), this method can no longer be applied as will be shown. Therefore, a new measurement method, based on the glance angle technique has been developed.Keywords
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