Parametric eddy current defect depth model and its application to graphite epoxy
- 30 June 1989
- journal article
- Published by Elsevier in NDT International
- Vol. 22 (3) , 139-148
- https://doi.org/10.1016/0308-9126(89)90001-1
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Detection of impact damage in CFRP laminatesPublished by Elsevier ,2003