Fine atomic image of mica cleavage planes obtained with an atomic force microscope (AFM) and a novel procedure for image processing
- 1 August 1997
- journal article
- Published by Elsevier in Chemical Physics
- Vol. 221 (1-2) , 23-31
- https://doi.org/10.1016/s0301-0104(97)00141-9
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Studies of Cleaved Surface of Phyllosilicates (Talc, Phlogopite and Muscovite) by using AFM and LEED.Hyomen Kagaku, 1996
- In situ Monitoring of Semiconductor Electrode Reactions Using by STM and AFM.Journal of The Surface Finishing Society of Japan, 1995
- Studies of Cleaved Surfaces of Layered Semi-Metals, Graphite and Phyllosilicates.Hyomen Kagaku, 1995
- Atomic-scale wear properties of muscovite mica evaluated by scanning probe microscopyApplied Physics Letters, 1994