Neutron, X-Ray Scattering And TEM Studies Of Ni-Ti Multilayers

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Abstract
Analysis of Ni-Ti multilayer neutron reflectors and supermirrors has been undertaken to identify the causes of the lower than expected observed scattering power and critical angle enhancement of Ni-Ti supermirrors. Results of these investigations have focused attention on cusp formation in the Ni-Ti bilayers as probable cause for the reduced neutron scattering power. Grazing angle x-ray and neutron scattering, wide angle neutron diffraction and analytical cross sectional TEM have been used in this investigation. The multilayers were produced by magnetron sputtering and ion-beam deposition on float glass substrates and silicon wafers.

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