Objective Measurement And Characterization Of Scratch Standards
- 5 April 1983
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- Vol. 0362, 86-92
- https://doi.org/10.1117/12.934137
Abstract
The manufacture of scratch standards for use with MIL-0-13830A has been hampered by the lack of an objective measurement technique. The U.S. National Bureau of Standards has therefore undertaken a comprehensive program to provide quantitative measurements of the light scattered by the scratches and to correlate them with assessments made by trained observers. In this paper, I apply scalar diffraction theory to developing design criteria for a polar scanning apparatus, describe an apparatus that includes a novel optical system, and show scans from one full set of secondary standards. Comparing these scans with the visual assessments is not straightforward.Keywords
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