Stability criterion for semiconductor plates with negative AC mobility
- 1 July 1972
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
- Vol. 60 (7) , 914-915
- https://doi.org/10.1109/proc.1972.8806
Abstract
The critical n0L product of semiconductor plates with negative longitudinal ac mobility and finite thickness is investigated theoretically as a function of the sample dimensions and the degree of dielectric loading. In case of a small sample thickness-to-length ratio the stability range is found to be strongly reduced due to higher order characteristic oscillations.Keywords
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