Use of vacuum tubes in test instrumentation for measuring characteristics of fast high-voltage semiconductor devices
Open Access
- 1 September 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. IM-30 (3) , 226-227
- https://doi.org/10.1109/TIM.1981.6312384
Abstract
Circuits are described that permit measurement of fast events occurring in power semiconductors. These circuits were developed for the dynamic characterization of transistors used in inductive-load switching applications. Fast voltage clamping using vacuum diodes is discussed, and reference is made to a unique circuit that was built for performing nondestructive, reverse-bias, second-breakdown tests on transistors.Keywords
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