The refractive-index distribution normal to the polished surface of fused quartz measured by ellipsometry
- 1 May 1979
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 50 (5) , 3653-3657
- https://doi.org/10.1063/1.326317
Abstract
One of the dominant factors influencing the frequency aging of a crystal oscillator is the amount of surface irregularity left by polishing upon its crystal resonator. This paper deals with the refractive‐index distribution of fused quartz as a measure of polished layer depth. It is found that the refractive‐index distribution can be expressed by a combination of an exponential function and a linear function. The refractive index decreases exponentially from a surface value of 1.736 to a certain value at a depth of 50±10 Å and from it decreases linearly to the bulk value of 1.460 at a depth of 2000±200 Å.This publication has 3 references indexed in Scilit:
- Ellipsometric studies of environment-sensitive polish layers of glassJournal of Applied Physics, 1977
- Photoelasticity of the cuprous halidesPhysical Review B, 1976
- Optical properties of non-crystalline Si, SiO, SiOx and SiO2Journal of Physics and Chemistry of Solids, 1971