The refractive-index distribution normal to the polished surface of fused quartz measured by ellipsometry

Abstract
One of the dominant factors influencing the frequency aging of a crystal oscillator is the amount of surface irregularity left by polishing upon its crystal resonator. This paper deals with the refractive‐index distribution of fused quartz as a measure of polished layer depth. It is found that the refractive‐index distribution can be expressed by a combination of an exponential function and a linear function. The refractive index decreases exponentially from a surface value of 1.736 to a certain value at a depth of 50±10 Å and from it decreases linearly to the bulk value of 1.460 at a depth of 2000±200 Å.

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