Electrochemical and Optical Properties of Thin Oxide Layers Formed on Fresh Titanium Surfaces in Acid Solutions

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Abstract
Optical properties and thicknesses of thin oxide layers formed electrochemically on Ti surfaces which were exposed by abrasion in situ were evaluated according to results of ellipsometric and reflectometric measurements. It is shown that the optical as well as some other physical properties of the thin oxide films are close to those of bulk Ti oxides and, hence, deviations of their electrochemical characteristics from those of bulk are most probably due only to their small thicknesses. Electroreduction of such films was also traced by the optical means and could be shown to result, under certain conditions, in some thinning and, especially, in the increase of the extinction coefficient of the film. The effect of such a reductive treatment on the electrochemical characteristics of the oxide layer is also discussed.

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