Single event effect testing of the Intel 80386 family and the 80486 microprocessor

Open Access

Publisher Website

19 November 2002

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 263-269
https://doi.org/10.1109/radecs.1995.509788

Abstract

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SEU tests of a 80386 based flight-computer/data-handling system and of discrete PROM and EEPROM devices, and SEL tests of discrete 80386, 80387, PROM, EEPROM and ASICs
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003