Thickness dependence of the magnetoresistance effect in RF sputtered thin permalloy films
- 1 September 1987
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 23 (5) , 2215-2217
- https://doi.org/10.1109/tmag.1987.1065272
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
- Four-point magnetoresistivity measurementsIEEE Transactions on Magnetics, 1983
- The measurement of magnetostriction in ferromagnetic thin filmsIEEE Transactions on Magnetics, 1976
- Quantum size effect in thin filmsThin Solid Films, 1974
- Magnetic bubble-domain detection: Review and outlookIEEE Transactions on Magnetics, 1973
- Size-Dependent Electrical Conduction in Thin Metal Films and WiresPublished by Elsevier ,1971
- Thickness-Dependent Oscillatory Behavior of Resistivity and Hall Coefficient in Thin Single-Crystal Bismuth FilmsJournal of Applied Physics, 1969
- Hall Effect in Thin Metal FilmsJournal of Applied Physics, 1967
- Investigation of a New Type of Oscillations in the MagnetoresistancePhysical Review Letters, 1964
- The mean free path of electrons in metalsAdvances in Physics, 1952
- The conductivity of thin metallic films according to the electron theory of metalsMathematical Proceedings of the Cambridge Philosophical Society, 1938