Extended electron energy‐loss fine structure and selected‐area electron diffraction studies of small palladium clusters
- 1 May 1992
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 166 (2) , 231-245
- https://doi.org/10.1111/j.1365-2818.1992.tb01521.x
Abstract
SUMMARY: Extended electron energy‐loss fine structure (EXELFS) and selected‐area electron diffraction (SAED) techniques have both been applied to the study of the crystalline structure of Pd clusters of average diameters ranging from bulk to 24 Å. The combined use of these techniques gives complementary information about the crystalline structure of Pd clusters. Both techniques show the same lattice parameter expansion, about 4% for the smallest Pd cluster, with respect to the bulk. The EXELFS analysis performed on the Pd‐M4,5 edge shows a sizeable increase of structural disorder in the smallest cluster. SAED gives additional information about the Pd bulk sample, showing the occurrence of crystalline regions about 50 Å in diameter.Keywords
This publication has 31 references indexed in Scilit:
- Palladium clusters on graphite: Evidence of resonant hybrid states in the valence and conduction bandsPhysical Review B, 1990
- Scanning tunneling microscopy of the local atomic structure of two-dimensional gold and silver islands on graphitePhysical Review Letters, 1988
- Surface electron-energy-loss fine-structure investigation on the local structure of copper clusters on graphitePhysical Review B, 1987
- Electronic and structural investigations of palladium clusters by x-ray absorption near-edge structure and extended x-ray absorption fine-structure spectroscopiesPhysical Review B, 1986
- Photoemission from small palladium clusters supported on various substratesPhysical Review B, 1986
- Band-structure approach to the x-ray spectra of metalsPhysical Review B, 1984
- Substrate-induced lattice strain in particulate palladium depositsThin Solid Films, 1983
- Structure of metal catalystsReviews of Modern Physics, 1979
- Extended x-ray-absorption fine-structure technique. III. Determination of physical parametersPhysical Review B, 1975
- Photo-Ionization in the Soft x-Ray Range: 1Dependence in a Central-Potential ModelPhysical Review B, 1968