In-plane epitaxial alignment of YBa2Cu3O7−x films grown on silver crystals and buffer layers

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Abstract
Superconducting YBa2Cu3O7−x (YBCO) films were grown by laser ablation on Ag(001), Ag(110), and Ag(111) single‐crystal surfaces. X‐ray diffraction measurements showed that, in all cases, the films were aligned with specific in‐plane epitaxial orientation with respect to the crystallographic axes of the substrate. The observed orientations were consistent with predictions of near‐coincident site lattice models of the YBCO‐Ag interface. This technique for achieving three‐dimensional film alignment was extended to include a Ag epitaxial buffer layer on mica in place of a bulk Ag crystal. In‐plane epitaxial alignment on metal substrates and buffer layers has important consequences in practical applications for inhibiting weak‐link behavior caused by high‐angle grain boundaries.