Nonlinear disturbance errors in system identification using multisine test signals
- 30 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 258-263
- https://doi.org/10.1109/imtc.1993.382639
Abstract
The errors introduced into linear system identification by nonlinear distortions are examined. A theoretical framework is presented for the distortion generated by odd power nonlinearities when using multisine test signals for frequency domain identification. It is shown that the distortion is a function of the number of test harmonics, their harmonic values and their phases. An explanation of previously published practical results is then given. This leads to the definition of a novel class of signals, termed no interharmonic distortion (NID) multisines, with interesting properties. The application of NID multisines to system testing with a recently proposed method of compensating for nonlinearities is examined. This allows the identification of the linear system and the straightforward calculation of the coefficient of the nonlinear term.<>Keywords
This publication has 4 references indexed in Scilit:
- Identification theory: Practical implications and limitationsPublished by Elsevier ,2003
- Design of test signals for identification of linear systems with nonlinear distortionsIEEE Transactions on Instrumentation and Measurement, 1992
- Nonparametric frequency response function estimators based on nonlinear averaging techniquesIEEE Transactions on Instrumentation and Measurement, 1992
- Crest-factor minimization using nonlinear Chebyshev approximation methodsIEEE Transactions on Instrumentation and Measurement, 1991