X-ray method for the structural investigation of thin organic films
- 1 January 1986
- journal article
- Published by EDP Sciences in Journal de Physique
- Vol. 47 (7) , 1249-1256
- https://doi.org/10.1051/jphys:019860047070124900
Abstract
The structures of thin lamellar films can be determined through a combination of three X-ray experiments using synchrotron radiation. Diffraction experiments in the transmission geometry give the intralamellar ordering, the diffraction at small glancing angles yields the interlamellar organization, and the critical reflection provides the density measurement which is required to obtain the number of structural units per cell. This method is illustrated here with the study of an organic compound deposited in Langmuir-Blodgett filmsKeywords
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