A simple model for fatigue life
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 37 (3) , 314-322
- https://doi.org/10.1109/24.3762
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Generation of random processes for fatigue testingStochastic Processes and their Applications, 1985
- Extremes and Related Properties of Random Sequences and ProcessesPublished by Springer Nature ,1983
- Fatigue Under Wide Band Random Stresses Using the Rain-Flow MethodJournal of Engineering Materials and Technology, 1977
- A General Statistical Model for Random FatigueJournal of Engineering Materials and Technology, 1974