Hybrid Field-Effect Transistor Based on a Low-Temperature Melt-Processed Channel Layer

• 3 December 2002
• journal article
• research article
• Published by Wiley in Advanced Materials
• Vol. 14  (23) , 1772-1776
• https://doi.org/10.1002/1521-4095(20021203)14:23<1772::aid-adma1772>3.0.co;2-y

Abstract

Keywords

• FIELD‐EFFECT TRANSISTORS
• INORGANIC‐ORGANIC HYBRID MATERIALS
• PROCESSING
• MELT
• X‐RAY DIFFRACTION (XRD)