Measurement and analysis of thin- and thick-target yield curves of narrow resonances with a high energy resolution ion beam
- 1 February 1992
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 64 (1-4) , 383-387
- https://doi.org/10.1016/0168-583x(92)95500-q
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- SPACES: A PC implementation of the stochastic theory of energy loss for narrow-resonance depth profilingNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990
- Improvements in targetry and high voltage stability for high resolution ion beam experimentsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1989