A low-noise conductivity microstructure instrument
- 1 January 1982
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
In rapid sampling of oceanic scalar microstructure, conductivity measurement offers advantages over temperature measurement in that conductivity probes can be designed to have fixed, free-flushing sample volumes, and their response is not limited by thermal diffusion times (an inherent problem with temperature sensors). Development of a "dual-needle" microstructure conductivity instrument is described, from its first use as a reference cell on a dynamic sensor calibration facility (salt-stratified tank) to more recent modifications and use in the open ocean. The cell used in the ocean had a centimeter-scale spatial resolution, compared with the millimeter-scale resolution achieved with the smaller version used in the stratified tank. An rms noise level of1 \times 10^{-6}s/m was achieved over a 1 to 100 Hz bandwidth (which at constant salinity corresponds to an equivalent rms temperature noise of 10 microdegrees C).Keywords
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