Automatic extraction of higher order interconnect parasitics for device level simulators for VHSIC applications
- 24 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Multilevel metal capacitance models for CAD design synthesis systemsIEEE Electron Device Letters, 1992
- Simple formulas for two- and three-dimensional capacitancesIEEE Transactions on Electron Devices, 1983