A wavelet-based method for multifractal image analysis. I. Methodology and test applications on isotropic and anisotropic random rough surfaces
- 1 May 2000
- journal article
- Published by Springer Nature in Zeitschrift für Physik B Condensed Matter
- Vol. 15 (3) , 567-600
- https://doi.org/10.1007/s100510051161
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: