Higher smectic-layer order parameters in liquid crystals determined by x-ray diffraction and the effect of antiferroelectricity
- 1 January 1995
- journal article
- Published by American Physical Society (APS) in Physical Review E
- Vol. 51 (1) , 400-406
- https://doi.org/10.1103/physreve.51.400
Abstract
No abstract availableKeywords
This publication has 19 references indexed in Scilit:
- Antiferroelectric chiral smectic liquid crystalsJournal of Materials Chemistry, 1994
- Study on Molecular Dimerization Inducing the Antiferroelectric Liquid Crystalline Phase by Measuring the Smectic Layer Thickness in Various CompoundsJapanese Journal of Applied Physics, 1993
- Invited Article. X-ray diffraction by mesomorphic comb-like polymersLiquid Crystals, 1992
- Stability of Antiferroelectricity and Causes for its Appearance in SmCα * and SmCA * Phases of a Chiral Smectic Liquid Crystal, MHPOBCJapanese Journal of Applied Physics, 1991
- Antiferroelectric chiral smectic-liquid crystalPhysical Review Letters, 1991
- Antiferroelectric Chiral Smectic Phases Responsible for the Trislable Switching in MHPOBCJapanese Journal of Applied Physics, 1989
- X-Ray Diffraction Intensities of a Smectic-Liquid CrystalPhysical Review Letters, 1980
- Experimental Observation of Anomalous Ordering in a Landau-Peierls SystemPhysical Review Letters, 1977
- High-Resolution X-Ray Study of a Second-Order Nematic—Smectic-Phase TransitionPhysical Review Letters, 1977
- Ferroelectric liquid crystalsJournal de Physique Lettres, 1975