Phase intergrowth in thin films
- 1 November 1993
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 48 (18) , 13945-13948
- https://doi.org/10.1103/physrevb.48.13945
Abstract
The presence of phase intergrowth in Bi-Sr-Ca-Cu-O thin films, in situ grown using a laser-ablation technique, has been investigated. A simple intergrowth model has been used to analyze the experimental x-ray-diffraction patterns of the films and has allowed us to measure the stacking-fault proportion in the films. Rutherford-backscattering spectrometry (RBS) has also been used in order to determine the cationic composition. The Bi/Cu ratio obtained by x-ray-diffraction analysis is in very good agreement with the results of RBS analysis. The intergrowth phenomenon allows one to change the structure continuously from one pure phase to another one, a fact that is experimentally observed when the oxygen pressure during deposition is changed.This publication has 10 references indexed in Scilit:
- Synthesis and characterization of Bi2Sr2Can−1CunOy(n=1–7) thin films grown by off-axis, three target magnetron sputteringJournal of Applied Physics, 1992
- Effects of oxygen pressure and substrate temperature on the in situ grown BiSrCaCuO films by laser ablationJournal of Applied Physics, 1992
- RBS study of in situ grown BiSrCaCuO filmsSolid State Communications, 1992
- Pressure dependence of Bi-Sr-Ca-Cu-O phases with laser deposition techniqueApplied Physics Letters, 1991
- Preparation, structure, and properties of the superconducting compound series withPhysical Review B, 1988
- High-Tc Phase Promoted and Stabilized in the Bi, Pb-Sr-Ca-Cu-O SystemJapanese Journal of Applied Physics, 1988
- Crystal substructure and physical properties of the superconducting phasePhysical Review B, 1988
- A New High-Tc Oxide Superconductor without a Rare Earth ElementJapanese Journal of Applied Physics, 1988
- Superconductivity in the Bi - Sr - Cu - O systemZeitschrift für Physik B Condensed Matter, 1987
- X-Ray Interference in Partially Ordered Layer LatticesThe Journal of Chemical Physics, 1942