Automatic Ellipsometer Automatic Polarimetry by Means of an ADP Polarization Modulator III
- 1 May 1966
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 5 (5) , 759-764
- https://doi.org/10.1364/ao.5.000759
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 7 references indexed in Scilit:
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- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963
- Photoelectric Measurement of Polarized Light by Means of an ADP Polarization Modulator II Photoelectric Elliptic PolarimeterJournal of the Optical Society of America, 1961
- The Polarization of Totally Reflected LightProceedings of the Physical Society. Section B, 1954
- On the Use of a Rotating Polarizer to Measure Optical Constants in the InfraredJournal of the Optical Society of America, 1954
- A Comparative Survey of Some Possible Systems of Polarized HeadlightsJournal of the Optical Society of America, 1948
- A Photoelectric Method for the Determination of the Parameters of Elliptically Polarized LightJournal of the Optical Society of America, 1937