Spectroscopy of Impurities and Complex Defects in Silicon in Zlectric and Microwave Fields
- 1 January 1987
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Impact ionization of excitons and electron-hole droplets in siliconPhysical Review B, 1987
- Optical detection of cyclotron resonance in GaP and ZnTeSolid State Communications, 1985
- Optically Detected Cyclotron Resonance in AgBrPhysica Status Solidi (b), 1985
- ac band conductivity in compensated semiconductors with potential fluctuationsPhysical Review B, 1984
- Effect of potential fluctuations on the transport properties and the photoconductivity of compensated semiconductors. Application to semi-insulating GaAs. I. Semiconductor under equilibrium conditionsJournal of Applied Physics, 1984
- Optical Detection of Cyclotron Resonance in SemiconductorsPhysical Review Letters, 1980
- Evidence for the spin-dependent scattering of conduction electrons on Mn2+ ions in Hg1−xMnxTe and Cd1−xMnxSe mixed crystalsSolid State Communications, 1980
- Electrical characterization of epitaxial layersThin Solid Films, 1976
- Thermal detection of the electron paramagnetic resonance of impurities in MgOJournal of Physics D: Applied Physics, 1973
- High-Sensitivity Magnetic Resonance by Bolometer DetectionJournal of Applied Physics, 1966