Mixed-mode simulation of DX trap-induced slow transient effects on AlGaAs/GaAs HEMT inverters
- 1 January 1991
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 38 (9) , 1993-1998
- https://doi.org/10.1109/16.83720
Abstract
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