Ion Beam Effects on Glass Surfaces
- 2 June 1982
- journal article
- Published by Wiley in Journal of the American Ceramic Society
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Limitations of ion etching for interface analysisSurface and Interface Analysis, 1981
- Phase changes in insulators produced by particle bombardmentNuclear Instruments and Methods, 1981
- Secondary-ion mass spectrometry (SIMS) analysis of electron-bombarded soda-lime-silica glassApplied Physics Letters, 1979
- X-ray photoemission study of a sodalimesilica glassSolid State Communications, 1976
- The influence of selective sputtering on surface compositionSurface Science, 1976
- X-ray photoelectron spectroscopic studies of PbO surfaces bombarded with He+, Ne+, Ar+, Xe+ and Kr+Surface Science, 1976
- Charging of insulators by ion bombardment and its minimization for secondary ion mass spectrometry (SIMS) measurementsJournal of Applied Physics, 1976
- Change of surface composition of SiO2 layers during sputteringJournal of Applied Physics, 1974
- Ion Neutralization Processes at Insulator Surfaces and Consequent Impurity Migration Effects in SiFilmsPhysical Review Letters, 1973
- Oxygen Outgassing Caused by Electron Bombardment of GlassJournal of Applied Physics, 1963