Contrast reversal of Kikuchi lines with specimen thickness

• 1 May 1970
• journal article
• Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A
• Vol. 26  (3) , 349-353
• https://doi.org/10.1107/s0567739470000839

Abstract

Keywords

• SILICON
• KIKUCHI PATTERNS
• CONTRAST WAS REVERSED
• THOMAS
• NORMAL KIKUCHI
• DEFECT LINE
• LINE PASS
• DIFFRACTED