Coaxial impact-collision ion scattering spectroscopy analysis of ZnO thin films and single crystals
- 6 November 1998
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 56 (2-3) , 256-262
- https://doi.org/10.1016/s0921-5107(98)00241-4
Abstract
No abstract availableKeywords
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